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Test design
Results: 2041

#	Item
421	IEEE Synchrophasor Measurement Test Suite Specification and Standards – Plus The IEEE Synchrophasor Measurement TSS provides a comprehensive, dependable plan that any manufacturer globally can use in the design stage t Add to Reading List Source URL: standards.ieee.org - Date: 2014-12-19 14:33:59
422	26 GPS TECHNOLOGY Smart Clocks Simplify 4G Timing Design As next generation Add to Reading List Source URL: www.spectratime.com Language: English - Date: 2014-07-17 12:32:31 Synchronization Horology Clocks Oscillators Electronic test equipment Global Positioning System Crystal oscillator Frequency counter Jitter Technology Measurement Electronics
423	(FINAL) FFIEC101Published Validity Edits.xls Series Effective Effective Type of Start Date End Date Change Add to Reading List Source URL: www.ffiec.gov Language: English - Date: 2015-04-01 10:48:14 Software engineering Design of experiments Hypothesis testing Statistical inference Null Test Statistical hypothesis testing Boolean data type /dev/null Computing Nothing Statistics
424	onTAP® Series 4000 with ProScan B o u n d a r y S c a n Add to Reading List Source URL: www.flynn.com Language: English - Date: 2011-06-14 10:41:17 Electromagnetism Electronic design automation Joint Test Action Group Boundary scan Netlist Cross-linked polyethylene OnTap Electronics manufacturing Manufacturing Electronic engineering
425	White Paper Test Automation of 3D Integrated Systems January 2012 Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 12:41:47 Integrated circuits Semiconductor device fabrication Through-silicon via Software testing Electronic design Automatic test pattern generation Boundary scan Automatic test equipment Synopsys Electronic engineering Electronics Technology
426	Claims experience monitoring Add to Reading List Source URL: fbe.unimelb.edu.au Language: English - Date: 2013-08-05 02:12:14 Hypothesis testing Design of experiments Econometrics Statistical hypothesis testing F-test Confidence interval Likelihood-ratio test Economic model Null hypothesis Statistics Statistical inference Statistical tests
427	IEEE Synchrophasor Measurement Test Suite Specification and Standards – Basic The IEEE Synchrophasor Measurement TSS provides a comprehensive, dependable plan that any manufacturer globally can use in the design stage Add to Reading List Source URL: standards.ieee.org - Date: 2014-12-19 14:32:26
428	Real-Time HIL/RCP Laboratory Study, design and test power electronics control algorithms using both OPAL-RT and Lab-Volt solutions. Electric Motor Laboratory Curriculum Goals Add to Reading List Source URL: www.labvolt.com Language: English - Date: 2014-02-18 13:49:59 Hardware-in-the-loop simulation Electronics Computing Real-time simulation Simulink Simulation Insulated gate bipolar transistor Simulation software Software Visual programming languages
429	onTAP Expert JTAG Test Development Service Expert JTAG Test Development Proprietary test development procedures include: * * Add to Reading List Source URL: www.flynn.com Language: English - Date: 2015-03-10 14:16:25 Electronic engineering Joint Test Action Group Boundary scan Design for testing Test Boundary scan description language Electronics manufacturing Manufacturing Electronics
430	Datasheet Yield Explorer Design-centric yield management Identify and eliminate Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2014-11-07 14:34:57 Electronic design automation Hillsboro Oregon Synopsys Physical design Yield Automatic test pattern generation Test engineer Electronic engineering Mechanics Physics

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